Noise exposure impact zone hue modeling using LISA FEA V.8. Teknik: Jurnal Ilmu Teknik dan Informatika, [S. l.], v. 2, n. 2, p. 57–66, 2022. DOI: 10.51903/teknik.v2i3.153. Disponível em: https://journal.stiestekom.ac.id/index.php/TEKNIK/article/view/153.. Acesso em: 22 dec. 2024.